Journal Articles
IET Science Measurement and Technology
Year : 2007
Moncef KADI : Connect in order to contact the contributor
https://normandie-univ.hal.science/hal-02306991
Submitted on : Monday, October 7, 2019-11:19:00 AM
Last modification on : Thursday, March 10, 2022-10:46:02 AM
Cite
I. Chahine, Moncef Kadi, E. Gaboriaud, X. Gallenne, A. Louis, et al.. Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances. IET Science Measurement and Technology, 2007, 1 (5), pp.240-244. ⟨10.1049/iet-smt:20060142⟩. ⟨hal-02306991⟩
Collections
4
View
0
Download