Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS) - Normandie Université Access content directly
Journal Articles Microelectronics Reliability Year : 2013
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hal-02306929 , version 1 (07-10-2019)

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F. Zhu, F. Fouquet, B. Ravelo, A. Alaeddine, Moncef Kadi. Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). Microelectronics Reliability, 2013, 53 (9-11), pp.1288-1292. ⟨10.1016/j.microrel.2013.07.077⟩. ⟨hal-02306929⟩
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