Conference Papers
Year : 2015
Moncef KADI : Connect in order to contact the contributor
https://normandie-univ.hal.science/hal-02306892
Submitted on : Monday, October 7, 2019-10:28:40 AM
Last modification on : Thursday, March 10, 2022-10:46:02 AM
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Fahim Hami, Habib Boulzazen, Moncef Kadi. High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩. ⟨hal-02306892⟩
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