High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations - Normandie Université Access content directly
Conference Papers Year : 2015

High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

Fahim Hami
  • Function : Author
Habib Boulzazen
Moncef Kadi
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hal-02306892 , version 1 (07-10-2019)

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Fahim Hami, Habib Boulzazen, Moncef Kadi. High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩. ⟨hal-02306892⟩
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