Simulation of conducted EMI in SiC MOSFET buck converters before and after aging - Normandie Université Access content directly
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hal-02306875 , version 1 (07-10-2019)

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Shawki Douzi, Mohamed Tlig, Jaleleddine Ben Hadj Slama, Moncef Kadi. Simulation of conducted EMI in SiC MOSFET buck converters before and after aging. 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT), Dec 2016, Hammamet, Tunisia. pp.171-176, ⟨10.1109/SETIT.2016.7939861⟩. ⟨hal-02306875⟩
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