Aging of GaN GIT under repetitive short-circuit tests - Normandie Université Access content directly
Conference Papers Year : 2018
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hal-02306848 , version 1 (07-10-2019)

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J-Z. Fu, F. Fouquet, Moncef Kadi, Pascal Dherbécourt. Aging of GaN GIT under repetitive short-circuit tests. 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia), May 2018, Xi'an, China. pp.189-193, ⟨10.1109/WiPDAAsia.2018.8734539⟩. ⟨hal-02306848⟩
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