Method of measuring scattering of x-rays, its applications and implementation device - Normandie Université Access content directly
Patents Year : 2012

Method of measuring scattering of x-rays, its applications and implementation device

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Dates and versions

hal-01949471 , version 1 (10-12-2018)

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  • HAL Id : hal-01949471 , version 1

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Gérard Coquerel, Morgane Sanselme, Anaïs Lafontaine. Method of measuring scattering of x-rays, its applications and implementation device. France, Patent n° : EP2694953A1. 2012. ⟨hal-01949471⟩
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