Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes - Normandie Université Access content directly
Conference Papers Year : 2014

Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes

Y. Cartigny
M. Sanselme
G. Coquerel
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hal-01941076 , version 1 (30-11-2018)

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  • HAL Id : hal-01941076 , version 1

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A. Lafontaine, Y. Cartigny, M. Sanselme, G. Coquerel. Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes. ISIC-19 (International Symposium on Industrial Crystallization), Sep 2014, Toulouse, France. ⟨hal-01941076⟩
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