<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-03174379</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-02T16:17:51+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Investigation of the aging of power GaN HEMT under operational switching conditions, impact on the power converters efficiency</title>
            <author role="aut">
              <persName>
                <forename type="first">A.M.</forename>
                <surname>Bouchour</surname>
              </persName>
              <idno type="halauthorid">1725483-0</idno>
              <affiliation ref="#struct-970"/>
              <affiliation ref="#struct-190310"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">A.</forename>
                <surname>El Oualkadi</surname>
              </persName>
              <idno type="halauthorid">1236417-0</idno>
              <affiliation ref="#struct-190310"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Pascal</forename>
                <surname>Dherbécourt</surname>
              </persName>
              <email type="md5">224ca490f39c12958a85e4b1de199e93</email>
              <email type="domain">univ-rouen.fr</email>
              <idno type="idhal" notation="string">pascal-dherbecourt</idno>
              <idno type="idhal" notation="numeric">175161</idno>
              <idno type="halauthorid" notation="string">22995-175161</idno>
              <idno type="ORCID">https://orcid.org/0000-0001-9110-358X</idno>
              <idno type="IDREF">https://www.idref.fr/069275483</idno>
              <affiliation ref="#struct-970"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">O.</forename>
                <surname>Latry</surname>
              </persName>
              <email type="md5">fa570233ec4384fe6f5c37c4485fcfcf</email>
              <email type="domain">univ-rouen.fr</email>
              <idno type="idhal" notation="string">olivierl</idno>
              <idno type="idhal" notation="numeric">175169</idno>
              <idno type="halauthorid" notation="string">8093-175169</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/E-9747-2011</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-2121-8864</idno>
              <idno type="IDREF">https://www.idref.fr/151805482</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/E-9747-2011</idno>
              <affiliation ref="#struct-970"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">A.</forename>
                <surname>Echeverri</surname>
              </persName>
              <idno type="halauthorid">1725484-0</idno>
              <affiliation ref="#struct-970"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>pascal</forename>
                <surname>dherbecourt</surname>
              </persName>
              <email type="md5">224ca490f39c12958a85e4b1de199e93</email>
              <email type="domain">univ-rouen.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2021-07-27 14:53:10</date>
              <date type="whenModified">2025-08-12 15:20:35</date>
              <date type="whenReleased">2021-07-28 18:20:41</date>
              <date type="whenProduced">2019</date>
              <date type="whenEndEmbargoed">2021-07-27</date>
              <ref type="file" target="https://normandie-univ.hal.science/hal-03174379v1/document">
                <date notBefore="2021-07-27"/>
              </ref>
              <ref type="file" subtype="author" n="1" target="https://normandie-univ.hal.science/hal-03174379v1/file/1-s2.0-S002627141930530X-am.pdf" id="file-3301434-2901433">
                <date notBefore="2021-07-27"/>
              </ref>
              <ref type="externalLink" target="https://www.sciencedirect.com/science/article/am/pii/S002627141930530X"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="386832">
                <persName>
                  <forename>pascal</forename>
                  <surname>dherbecourt</surname>
                </persName>
                <email type="md5">224ca490f39c12958a85e4b1de199e93</email>
                <email type="domain">univ-rouen.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-03174379</idno>
            <idno type="halUri">https://normandie-univ.hal.science/hal-03174379</idno>
            <idno type="halBibtex">bouchour:hal-03174379</idno>
            <idno type="halRefHtml">&lt;i&gt;Microelectronics Reliability&lt;/i&gt;, 2019, 100-101, pp.113403. &lt;a target="_blank" href="https://dx.doi.org/10.1016/j.microrel.2019.113403"&gt;&amp;#x27E8;10.1016/j.microrel.2019.113403&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Microelectronics Reliability, 2019, 100-101, pp.113403. &amp;#x27E8;10.1016/j.microrel.2019.113403&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://about.hal.science/hal-authorisation-v1/">HAL Authorization<ref corresp="#file-3301434-2901433"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="CEA">CEA - Commissariat à l'énergie atomique</idno>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="INSA-ROUEN">Institut National des Sciences Appliquées de Rouen</idno>
            <idno type="stamp" n="ENSI-CAEN">Ecole Nationale Supérieure d'Ingénieurs de Caen</idno>
            <idno type="stamp" n="COMUE-NORMANDIE">Normandie Université</idno>
            <idno type="stamp" n="DSV" corresp="CEA">Direction de la recherche fondamentale - sciences du vivant</idno>
            <idno type="stamp" n="GPM">Groupe de physique des matériaux </idno>
            <idno type="stamp" n="CEA-DRF" corresp="CEA">Direction de Recherche Fondamentale</idno>
            <idno type="stamp" n="UNIROUEN">Université de Rouen Normandie</idno>
            <idno type="stamp" n="ENSICAEN">École Nationale Supérieure d’Ingénieurs de Caen</idno>
            <idno type="stamp" n="UNICAEN">Université de Caen Normandie</idno>
            <idno type="stamp" n="INSA-GROUPE">Groupe INSA</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Investigation of the aging of power GaN HEMT under operational switching conditions, impact on the power converters efficiency</title>
                <author role="aut">
                  <persName>
                    <forename type="first">A.M.</forename>
                    <surname>Bouchour</surname>
                  </persName>
                  <idno type="halauthorid">1725483-0</idno>
                  <affiliation ref="#struct-970"/>
                  <affiliation ref="#struct-190310"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">A.</forename>
                    <surname>El Oualkadi</surname>
                  </persName>
                  <idno type="halauthorid">1236417-0</idno>
                  <affiliation ref="#struct-190310"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Pascal</forename>
                    <surname>Dherbécourt</surname>
                  </persName>
                  <email type="md5">224ca490f39c12958a85e4b1de199e93</email>
                  <email type="domain">univ-rouen.fr</email>
                  <idno type="idhal" notation="string">pascal-dherbecourt</idno>
                  <idno type="idhal" notation="numeric">175161</idno>
                  <idno type="halauthorid" notation="string">22995-175161</idno>
                  <idno type="ORCID">https://orcid.org/0000-0001-9110-358X</idno>
                  <idno type="IDREF">https://www.idref.fr/069275483</idno>
                  <affiliation ref="#struct-970"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">O.</forename>
                    <surname>Latry</surname>
                  </persName>
                  <email type="md5">fa570233ec4384fe6f5c37c4485fcfcf</email>
                  <email type="domain">univ-rouen.fr</email>
                  <idno type="idhal" notation="string">olivierl</idno>
                  <idno type="idhal" notation="numeric">175169</idno>
                  <idno type="halauthorid" notation="string">8093-175169</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/E-9747-2011</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-2121-8864</idno>
                  <idno type="IDREF">https://www.idref.fr/151805482</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/E-9747-2011</idno>
                  <affiliation ref="#struct-970"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">A.</forename>
                    <surname>Echeverri</surname>
                  </persName>
                  <idno type="halauthorid">1725484-0</idno>
                  <affiliation ref="#struct-970"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">17084</idno>
                <idno type="issn">0026-2714</idno>
                <idno type="eissn">1872-941X</idno>
                <title level="j">Microelectronics Reliability</title>
                <imprint>
                  <publisher>Elsevier</publisher>
                  <biblScope unit="volume">100-101</biblScope>
                  <biblScope unit="pp">113403</biblScope>
                  <date type="datePub">2019</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1016/j.microrel.2019.113403</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <classCode scheme="halDomain" n="spi.nano">Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>This paper investigates the aging of a 650 V, 30 A GaN HEMT power transistor under operational switching conditions. The switching stress respects the Safe Operation Area (SOA) of the tested transistor. The aging campaign lasted 1008 h and was carried out through a developed switching application with high power efficiency. The global aging results show the degradation of five parameters: drain current ID, on-state resistance RDS(ON), transconductance gm, gate leakage current IGSS, and threshold voltage VTH. The major causes that affect the reliability of the GaN HEMT are hard switching, long time of test and high intensity of the stress. The existence of trapped charge in the gate-drain access region after aging is demonstrated using pulsed measurements. The effects of this degradation on power converters are studied by modeling the static characteristics of the aged GaN HEMT using an accurate method based on the Levenberg-Marquardt Algorithm. The accuracy and consistent convergence of the developed SPICE model provide a good way to investigate the reliability of GaN HEMTs by a simulation approach.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-970" status="VALID">
          <idno type="IdRef">142634867</idno>
          <idno type="RNSR">199612405F</idno>
          <idno type="ROR">https://ror.org/03c2k2909</idno>
          <orgName>Groupe de physique des matériaux</orgName>
          <orgName type="acronym">GPM</orgName>
          <desc>
            <address>
              <addrLine>Avenue de l'Université, BP 08, 76801 Saint-Etienne-du-Rouvray Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://gpm.univ-rouen.fr</ref>
          </desc>
          <listRelation>
            <relation active="#struct-300318" type="direct"/>
            <relation active="#struct-455934" type="indirect"/>
            <relation active="#struct-301288" type="direct"/>
            <relation active="#struct-301232" type="indirect"/>
            <relation name="UMR6634" active="#struct-441569" type="direct"/>
            <relation active="#struct-1042533" type="direct"/>
            <relation active="#struct-7127" type="indirect"/>
            <relation active="#struct-246955" type="indirect"/>
            <relation active="#struct-300016" type="indirect"/>
            <relation name="FR3095" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-190310" status="VALID">
          <orgName>Ecole Nationale des Sciences Appliquées [Tanger]</orgName>
          <orgName type="acronym">ENSAT</orgName>
          <desc>
            <address>
              <addrLine>BP 1818 Tanger Principal Tanger</addrLine>
              <country key="MA"/>
            </address>
            <ref type="url">http://www.ensat.ac.ma/Portail/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-300318" status="VALID">
          <idno type="IdRef">026403919</idno>
          <idno type="ISNI">0000000121083034</idno>
          <idno type="ROR">https://ror.org/03nhjew95</idno>
          <orgName>Université de Rouen Normandie</orgName>
          <orgName type="acronym">UNIROUEN</orgName>
          <date type="start">1966-01-01</date>
          <desc>
            <address>
              <addrLine>1, rue Thomas Becket 76821 Mont-Saint-Aignan Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.univ-rouen.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-455934" type="direct"/>
          </listRelation>
        </org>
        <org type="regroupinstitution" xml:id="struct-455934" status="VALID">
          <idno type="IdRef">190906332</idno>
          <idno type="ISNI">0000000417859671 </idno>
          <idno type="ROR">https://ror.org/01k40cz91</idno>
          <orgName>Normandie Université</orgName>
          <orgName type="acronym">NU</orgName>
          <date type="start">2015-01-01</date>
          <desc>
            <address>
              <addrLine>Esplanade de la Paix - CS 14032 - 14032 Caen Cedex 5</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.normandie-univ.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-301288" status="VALID">
          <idno type="IdRef">033364346</idno>
          <idno type="ISNI">0000000121908462</idno>
          <idno type="ROR">https://ror.org/020ws7586</idno>
          <orgName>Institut national des sciences appliquées Rouen Normandie</orgName>
          <orgName type="acronym">INSA Rouen Normandie</orgName>
          <date type="start">1985-01-01</date>
          <desc>
            <address>
              <addrLine>Avenue de l’Université 76801 Saint-Étienne-du-Rouvray Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.insa-rouen.fr</ref>
          </desc>
          <listRelation>
            <relation active="#struct-301232" type="direct"/>
            <relation active="#struct-455934" type="direct"/>
          </listRelation>
        </org>
        <org type="regroupinstitution" xml:id="struct-301232" status="VALID">
          <idno type="IdRef">162105150</idno>
          <orgName>Institut National des Sciences Appliquées</orgName>
          <orgName type="acronym">INSA</orgName>
          <desc>
            <address>
              <country key="FR"/>
            </address>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
        <org type="regrouplaboratory" xml:id="struct-1042533" status="VALID">
          <idno type="RNSR">200810701B</idno>
          <orgName>Institut de Recherche sur les Matériaux Avancés</orgName>
          <orgName type="acronym">IRMA</orgName>
          <date type="start">2008-01-01</date>
          <desc>
            <address>
              <addrLine>6 bd du marechal Juin14050 CAEN CEDEX 4</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://irma.cnrs.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-7127" type="direct"/>
            <relation active="#struct-455934" type="indirect"/>
            <relation active="#struct-246955" type="direct"/>
            <relation active="#struct-300016" type="direct"/>
            <relation active="#struct-300318" type="direct"/>
            <relation active="#struct-301288" type="direct"/>
            <relation active="#struct-301232" type="indirect"/>
            <relation name="FR3095" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-7127" status="VALID">
          <idno type="IdRef">026403064</idno>
          <idno type="ISNI">0000000121864076</idno>
          <idno type="ROR">https://ror.org/051kpcy16</idno>
          <orgName>Université de Caen Normandie</orgName>
          <orgName type="acronym">UNICAEN</orgName>
          <date type="start">1432-01-01</date>
          <desc>
            <address>
              <addrLine>Esplanade de la Paix - CS 14032 - 14032 CAEN Cedex 5</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.unicaen.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-455934" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-246955" status="VALID">
          <idno type="IdRef">190907991</idno>
          <idno type="ROR">https://ror.org/01fpqqe90</idno>
          <orgName>École Nationale Supérieure d'Ingénieurs de Caen</orgName>
          <orgName type="acronym">ENSICAEN</orgName>
          <desc>
            <address>
              <addrLine>6, Boulevard du Maréchal Juin CS 45053 14050 CAEN cedex 04</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.ensicaen.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-455934" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-300016" status="VALID">
          <idno type="IdRef">026372061</idno>
          <idno type="ISNI">0000000122998025</idno>
          <idno type="ROR">https://ror.org/00jjx8s55</idno>
          <idno type="Wikidata">Q868550</idno>
          <orgName>Commissariat à l'énergie atomique et aux énergies alternatives</orgName>
          <orgName type="acronym">CEA</orgName>
          <desc>
            <address>
              <addrLine>Centre de SaclayCentre de GrenobleCentre de Cadaracheetc</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.cea.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>